A 242083 | Reliability Engineering | Feasibility Study

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  NPRD-91 (NONELECTRONIC PARTS RELIABILITY DATA, 1991)
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  O I Ordering No.: NPRD-91 AD-A242 083 - I Ili ii 11 ll uifiiililff11111 NONELECTRONIC PARTS RELIABILITY DATA 1991 Prepared by: William Denson, Greg Chandler, William Crowell, & Rick Wanner Reliability Analysis Center PO Box 4700 Rome, NY 13440-8200 Under contract to: Rome Laboratory Griffiss AFB, NY 13441-5700 Reliability Analysis center A DoD Information Analysis Center 91-14878 Approved for Public Release, Distribution Unlimited 1Q  The Reliability Analysis Center (RAC) is a Department of Defense Information Analysis Center sponsored by the Defense Technical Information Center, managed by the Rome Laboratory (formerly RADC), and operated by lIT Research Institute (IITRI). RAC is chartered to collect, analyze and disseminate reliability information pertaining to systems and parts used therein. The present scope includes integrated circuits, hybrids, discretesemiconductors, microwave devices, optoelectronics and nonelectronic parts employed in military, space, industrial and commercial applications. The scope of the reliability activities include the related disciplines of Maintainability, Testability, Statistical ProcessControl, Electrostatic Discharge, and Total Quality Management. The data contained in the RAC databases are collected on a continuous basis from a broad range of sources, including testing laboratories, device and equipment manufacturers, government laboratories and equipment users (government and industry). Automatic distribution lists, voluntary data submittals and field failure reporting systems supplementan intensive data solicitation program. Users of RAC data are encouraged to submit reliability data to RAC to enhance these data collection efforts. Reliability data and analysis documents covering most of the device types mentionedabove are available from -:-e RAC. Also, RAC provides reliability consulting, training, technical and bibliographic ± quiry services which are noted at the end of this document. REQUEST FOR TECHNICAL ALL OTHER REQUESTS ASSISTANCE AND INFORMATION SHOULD BE DIRECTED TO: ON AVAILABLE RAC SERVICES AND PUBLICATIONS MAY BE DIRECTED TO: Reliability Analysis Center Rome Laboratory P.O. Box 4700 RBE/Duane A. Gilmour Rome, NY 13440-8200 Griffiss AFB, NY 13441-5700 TQM Inquiries: (800) 526-4804 Telephone: (315) 330-2540 Non-Technical Inquiries: (315) 330-4151 Autovon: 587-2540(315) 337-0900 Technical Inquiries: (315) 337-9933 TeleFax: (315) 337-9932 © 1991, IIT Research Institute All Rights Reserved ii  REPORT DOCUMENTATION PAGE Form Approved I OMB No. 0704-0188 Public reporting burden for this collection of inforration is estimated to average 1 hjur per response, including the time for reviewing instructions, searching, existi g data sources, gathering and maintaining the data needed, and completing and revewing the collection of information. Send comments regarding this burden estimate or ary other aspect of this collection of information, including suggestions for dducing this burden, to Washington Headquarters Services, Directorate for Information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlincon. VA 22202-4302. and to the Office of Management and Budget. Paperwork Reduction Project (0704-0188), Wabhington, DC 20503). 1.AGENCY USE ONLY (Leave Blank) 2. REPORT DATE 3. REPORT TYPE AND DATES COVERED 1 May1991 I 4.TITLE AND SUBTITLE 5. FUNDING NUMBERS Nonelectronic Parts Reliability Data 1991 65802S 6.AUTHOR(S) William Denson, Greg Chandler, William Crowell, Rick Wanner 7.PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES) 8. PERFORMING ORGANIZATION Reliability Analysis Center REPORT NUMBER PO Box 4700Rome, NY 13440-8200 NPRD-91 9.SPONSORING/MONITORING AGENCY NAME(S) AND ADDRESS(ES) 10. SPONSORING/MONITORING AGENCY DTIC REPORT NUMBER Cameron Station Alexandria, VA 22314-6145 F30602-91-C-0002 1 .SUPPLEMENTARY NOTES: Hard copies available from the Reliability Analysis Center, PO Box 4700, Rome, NY 13440-8200. (Price: $150.00 U.S., $170.00 Non-U.S.). DTIC will provide microfiche copies at standard microfiche price. Software version also available from RAC (Price: $400.00 U.S., $440.00 Non-U.S.). 12a.DISTRIBUTION/AVAILABILITY STATEMENT 12b. DISTRIBUTION CODE Approved for public release; 6;stribution unlimited. Available from RAC Unclassified or DTIC. Microfiche available from DTIC. 13. ABSTRACT (Maximum 200 words) This document provides failure rate data for a wide variety of component types including mechanical, electomechanical, and discrete electronic parts and assemblies. It also provides summary failures rates for numerous part categories by quality level and environment.Data represents a compilation of field experience in military, commercial, and industrial applications, and concentrates on items not covered by MIL-HDBK-217, Reliability Prediction of Electronic Equipment. Data tables include part descriptions,quality levels, application environments, point estimates of failure rate, data sources, number of failures, total opeiating hous, and detailed part characteristics. _ ... , / 14 - SUBJEcT TERMS 15. NUMBER OF PAGES Mechanical -,Nonelectronic Electro-mechanical Reliability;Prediction 16. PRICE CODE 7 SECUR'TY CLASSSIFCATION 18 SECURITY CLASSiFICATION 19.SECURITY CLASS'FICATION 20 .IIMITATION OF ABSTRACT NSN 7540-01-280-550C Standard Form 298 (Rev. 2-89) Prescrbed by ANSI Std Z349-18 298-102 iii=  The information and data contained herein have been compiled fromgovernment and nongovernment technical reports and from material supplied by various manufacturers and are intended to be used for reference purposes. Neither the United States Government nor lIT Research Institute warrant the accuracy of this information and data. The user is further cautioned that the data contained herein may not be used in lieu of other contractually cited references and specifications.Publication of this information is not an expression of the opinion of The United States Government or of lIT Research Institute as to the quality or durability of any product mentioned herein and any use for advertising or promotional purposes of this information in conjunction with the name of The United States Government or lIT Research Institute without writtenpermission is expressly prohibited. iv
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